Researchers from the labs of Professors Vinayak Dravid and Omar Farha developed a high-resolution approach to map ...

Researchers at the California NanoSystems Institute at UCLA published a step-by-step framework for determining the ...

Support grids are a key part of electron microscopy measurements; the choice of the grid can directly influence the quality and accuracy of the final image. This is particularly true for transmission ...

In this interview, AZoMaterials speaks with Professor Sarah Haigh, Professor of Materials Characterization at the University of Manchester, about her pioneering work in electron microscopy and its ...

Electron microscopy combined with X-ray microanalysis represents a pivotal suite of techniques that have transformed research in materials science, physics and engineering. Utilizing focused beams of ...

Using a STEM-in-SEM conversion holder, we can convert a scanning electron microscope into a scanning transmission microscope. Neat!

The FEI 200kV Titan Themis Scanning Transmission Electron Microscope (STEM) is a scanning transmission electron microscope with several key capabilities. This microscope positions Michigan Tech ...

Today we are machining some metal inside the scanning electron microscope! By creating a custom fixture, we can manually ...

In transmission electron microscopy (TEM), where the electron beam passes through the sample to be directly imaged on the detector below, it is often necessary to support the thin samples on a grid.

The Thermo Fisher Apreo 2 Variable Pressure Field Emission Scanning Electron Microscope (FE-SEM) is a thermionic field emission high-resolution scanning electron microscope. The Apreo 2 FE-SEM is an ...