This concept isn’t new—in fact, it is the essence of representational state transfer (REST). Instead of converting to a ...

Abstract: This paper presents a novel voltage-ramping (V-ramp) wafer-level electromigration (EM) testing method aimed at reducing testing time. The EM behavior of copper (Cu) metal lines with both ...

While we may have gotten away with high-volume, high-intensity training and minimal recovery in our twenties, we lose some of that flexibility as time goes on. Gone are the days when we could down a ...